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wireless alarm system (message monitoring alarm system): smart phone can combine with monitoring alarm system of equipment perfectly.swt (h) series high & low temperature (humidity) walk-in test chambehigh & low temperature (humidity) walk-in test
wireless alarm system (message monitoring alarm system): smart phone can combine with monitoring alarm system of equipment perfectly.
swt (h) series high & low temperature (humidity) walk-in test chambe
high & low temperature (humidity) walk-in test chamber improve reliability and lower the power consumption at the same time. it adopts temperature & humidity control system and different kinds of new energy saving technologies which can achieve automatic and simplified control. operator can walk into the chamber to operate the specimens; these products provide temperature & humidity environmental testing condition for aviation products, large parts of manufacturer, semi-finished products, etc.
features:
1.according to different products requirements from customer, this chamber will be assembled in customer site.
2.high tech design with good air flow provides a good temperature (humidity) uniformity to avoid any dead corner.
3.the chamber has 7’’ color touch screen which has english version, color display screen, digit settings, pid automatic adjustment, error correction, history curve recorder, etc. it’s very easy to operate.
4.the programs adopt human-computer method so that user can operate without any obstacle for the first time use.
5.wireless alarm system (message monitoring alarm system): smart phone can combine with monitoring alarm system of equipment perfectly.
6.every product will be customized by customer’s requirements to make sure the compatibility, energy conservation, high efficiency of the equipment.
7.cooling method can be air cooled or water cooled according to different requirements.
application standard
high & low temperature (humidity) walk-in test chamber
the conditions can be meet
the testing can be done
l gb/t 10586-2006 humidity test chamber technical condition
l gb/t 10589-2008 low temperature test chamber technical condition
l gb/t 10592-2008 high & low temperature test chamber technical condition
l gb/t 11158-2008 high temperature test chamber technical condition
l gb/t-2423.1-2008(iec68-2-1) testing a: low temperature testing method
l gb/t-2423.2-2008(iec68-2-2) testing b: high temperature testing method
l gb/t-2423.3-2008(iec68-2-3) testing ca: constant humidity testing method
l gb/t-2423.4-2008(iec68-2-30) testing dd: alternating humidity testing method
l gjb-360.8-87(mil-std-202f) high temperature aging testing
l gjb-150.3(mil-std-810d) high temperature testing method
l gjb-150.4(mil-std-810d) low temperature testing method
l gjb-150.9-93(mil-std-810d) humidity testing method
reference case: